Parametric Feature Selection for an Enhanced Random Linear Oracle Ensemble Method

Authors

  • B. P. Ooi School of Mechatronic Engineering, University Malaysia Perlis, 02600 Arau, Perlis, Malaysia.
  • N. Abdul Rahim School of Mechatronic Engineering, University Malaysia Perlis, 02600 Arau, Perlis, Malaysia.
  • A. Zakaria School of Mechatronic Engineering, University Malaysia Perlis, 02600 Arau, Perlis, Malaysia.
  • M. J. Masnan Institute of Engineering Mathematics, University Malaysia Perlis, 02600 Arau, Perlis, Malaysia.
  • S. A. Abdul Shukor School of Mechatronic Engineering, University Malaysia Perlis, 02600 Arau, Perlis, Malaysia.
  • Paulraj M. P. Sri Ramakrishna Institute of Technology, Perur Chettipalayam, Pachapalayam, Coimbatore – 641010, Tamilnadu, India.

Keywords:

Ensemble, Feature Selection, Naïve Bayes, Pattern Recognition, Random Linear Oracle,

Abstract

Random Linear Oracle (RLO) utilized classifier fusion-selection approach by replacing each classifier with two mini-ensembles separated by an oracle. This research investigates the effect of t-test feature selection toward classification performance of RLO ensemble method. Naïve Bayes (NB) classifier has been chosen as the base classifier due to its elegant simplicity and computationally inexpensive. Experiments were carried out using 30 data sets from UCI Machine Learning Repository. The results showed that RLO ensemble could greatly improve the ability of NB classifier in dealing with more data with different properties. Moreover, RLO ensemble receives benefits from feature selection algorithm, with a properly selected number of features from ttest, the performance of ensemble can be improved.

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Published

2018-05-29

How to Cite

Ooi, B. P., Abdul Rahim, N., Zakaria, A., Masnan, M. J., Abdul Shukor, S. A., & M. P., P. (2018). Parametric Feature Selection for an Enhanced Random Linear Oracle Ensemble Method. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 10(1-13), 111–116. Retrieved from https://jtec.utem.edu.my/jtec/article/view/4133

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