Characterization of a 0.35-Micron-Based Analog MPPT IC at Various Process Corners

Authors

  • Lean Karlo Tolentino Electronics Engineering Department, College of Engineering, Technological University of the Philippines, Manila, Philippines.
  • Febus Reidj Cruz Mapua Institute of Technology, School of Electrical, Electronics, and Computer Engineering, Manila, Philippines. Department of Electronic Engineering, Chung Yuan Christian University, Chungli City, Taiwan R.O.C.
  • Wen-Yaw Chung Department of Electronic Engineering, Chung Yuan Christian University, Chungli City, Taiwan R.O.C.

Keywords:

MPPT, Process Corners, Solar Panel, Tracking Efficiency,

Abstract

An analogue maximum power point tracking (MPPT) controller integrated circuit (IC) based on ripple correlation control was modified for low voltage applications in this study to harvest the maximum power from the photovoltaic array or solar panel under partial shading and changes in temperature. The IC was implemented in TSMC 0.35um 2P4M 5V mixed-signal CMOS technology. It was simulated at various process corners namely: typical-typical (TT); slow-slow (SS); fast-fast (FF); slow-fast (SF); and fast-slow (FS). The simulation results showed that at a 400 W/m2 solar irradiance and 25 degrees Celsius temperature, the tracking efficiencies are 99.18%, 98.55%, 98.89%, 98.96%, and 98.90% at different process corners, TT, FF, FS, SF, and SS, respectively.

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Published

2018-02-19

How to Cite

Tolentino, L. K., Cruz, F. R., & Chung, W.-Y. (2018). Characterization of a 0.35-Micron-Based Analog MPPT IC at Various Process Corners. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 10(1-9), 179–186. Retrieved from https://jtec.utem.edu.my/jtec/article/view/3897

Issue

Vol. 10 No. 1-9: Breakthrough To Excellence in Communication and Computer Engineering V

Section

Articles

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