SEU Rate in 90nm and 180nm of 6T SRAM at NEqO Orbit
Keywords:RazakSAT, Single Event Upset (SEU), Near Equatorial Orbit (NEqO), On-Board Computer (OBC), Ionization
AbstractRazakSat® was a remote sensing satellite which functioned as to acquire the information from the earth surface. RazakSat® was launched to low altitudes, around 600km above the earth surface in 2009. Although RazakSat® was a low altitude satellite but the malfunction of the RazakSat® was suspected experienced high rates of anomalies. The main factor of getting high rates of anomalies is due to the RazakSat® was exposed to space radiation environment when the satellite passed through the South Atlantic region at its NEqO trajectory. An investigation was carried out to predict the Single Event Upset (SEU) rate for 6T SRAM, which is located at On-Board Computer (OBC) of the satellite. The results show that the Q node in 6T SRAM is the most sensitive node and this node becomes the main focus in this paper in order to estimate direct ionisation induced SEU rates in the worst case scenario. Apart from that, the comparison by using 90nm and 180nm of 6T SRAM are shown whereby with 90nm, around 1083.5 error/bit day is occurred and there is around 4.538 errors/bit day is found by using 180nm of the 6T SRAM.
R.Heirtzler, The Future of the South Atlantic Anomaly And Implications for Radiation Damage in Space, Journal of Atmospheric and Solar-Terrestrial Physics 64, 1701–1708 (2002)
Hamilton. B, Macmillan. S, Beggan. C, Thomson. A, Turbitt. C, Predicting the South Atlantic Anomaly, Magnetic Relaxation (2012)
F.Javier Pavon-Carrasco, Angelo De Santis, The South Atlantic Anomaly: The Key for a Possible Geomagnetic Reversal, Frontiers in Earth Science: Geomagnetism and Paleomagnetism (2016)
Vernov S.N., Gorchakov E.V, Shavrin P.I., Sharvina K.N., Terrestrial CorpusularRadiation and Cosmic Rays, Space Science Revision 7, 490-533 (1967)
Heirtzler J.R, The Future of The South Atlantic Anomaly and Implications for Radiation Damage in Space, Journal Atmosphere Solar Terrestrial Physics 64, 1701-1708 (2002)
G.P. Ginet, D. Madden, B.K. Ditcher, D.H. Brautigam, Energetic Proton Maps for the South Atlantic Anomaly, IEEE Radiation Effects Data Workshop, pg 1-8 (2007)
Mohamed Abu Rahma, Mohab Anis, Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield, pp.49-57 (2012)
J. S. Fu, C. L. Axness, and H. T. Weaver, Memory SEU simulations using 2-D transport calculations, IEEE Electron.Device Lett., vol. 6, pp. 422–424, Aug (1985)
L. Anghel and M. Nicolaidis, Cost reduction and evaluation of a temporary faults detecting technique, Design,Automation and Test in Europe Conference and Exhibition 2000, pp. 591–598 (2000)
Jahinuzzaman, S. M., Sharifkhani, M., & Sachdev, M., An analytical model for soft error critical charge of nanometric SRAMs. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, 17(9), 1187-1195 (2009)
Murat Hudaverdi, Ilknur Baylakoglu, Space Environment and Evaluation for RASAT, International Conference on Recent Advances in Space Technologies, pg 926 – 931(2011)
K. Hirose et al., SEU resistance in advanced SOI-SRAMs fabricated by commercial technology using a rad-hard circuit design, IEEE Transactions on Nuclear Science, 49(6) (2002)
Gaurav Saxena, Rekha Agrawal, Sandhya Sharma, Single Event Upset (SEU) in SRAM, vol. 3(4), pp. 2171-2175(2013).
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