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Control Factors Optimization on Threshold Voltage and Leakage Current in 22 nm NMOS Transistor Using Taguchi Method

Afifah Maheran A.H., Menon P.S., I. Ahmad, F. Salehuddin, A.S. Mohd Zain, Noor Faizah Z. A., H.A. Elgomati

137-141

2017-09-01

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