Optical, Electrical and Structural Investigation on Different Molarities of Titanium Dioxide (TiO2) via Sol-Gel Method


  • Angelina Harry Faculty of Engineering, Universiti Malaysia Sarawak (UNIMAS), 94300 Kota Samarahan, Sarawak, Malaysia.
  • Marini Sawawi Faculty of Engineering, Universiti Malaysia Sarawak (UNIMAS), 94300 Kota Samarahan, Sarawak, Malaysia.
  • Muhammad Kashif Faculty of Engineering, Universiti Malaysia Sarawak (UNIMAS), 94300 Kota Samarahan, Sarawak, Malaysia.
  • Siti Kudnie Sahari Faculty of Engineering, Universiti Malaysia Sarawak (UNIMAS), 94300 Kota Samarahan, Sarawak, Malaysia.
  • Mohammad Rusop NANO-Scitech Centre (NST), Institute of Science, Universiti Teknologi Mara (UiTM), 40450 Shah Alam, Selangor, Malaysia.


Sol-Gel, TiO2, Thin Film, Properties


Titanium dioxide (TiO2) solution having different molarities were synthesized and deposited on glass substrates by using sol-gel spin-coating method. The variation in thickness, optical, electrical and structural properties of TiO2 thin films were investigated by surface profiler (SP), UV-Vis spectroscopy, two-point probes and atomic force microscopy (AFM), respectively. The result show that the thickness of TiO2 thin film increases as the molarities increases. The optical band gap energy decreases from 3.78 eV to 3.07 eV as the TiO2 molarities increases from 0.01M to 0.20M. The maximum value of the absorption coefficient was 16.27 x 104 cm-1 at 0.20M with surface roughness of 21.45 nm. Thin films deposited with 0.01M show lower absorption coefficient (3.87 x 104 cm-1) within visible region with surface roughness of 5.21 nm. The improvement in optical and structural properties of TiO2 thin films affects the electrical properties as the highest conductivity 9.62 x 102 S/m is obtained by 0.20M.


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How to Cite

Harry, A., Sawawi, M., Kashif, M., Sahari, S. K., & Rusop, M. (2016). Optical, Electrical and Structural Investigation on Different Molarities of Titanium Dioxide (TiO2) via Sol-Gel Method. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 8(12), 87–91. Retrieved from https://jtec.utem.edu.my/jtec/article/view/1441