The Removal of Specular Reflection in Noisy Iris Image

Authors

  • Shahrizan Jamaludin Centre for Computer Engineering Studies, Faculty of Electrical Engineering, Universiti Teknologi MARA, 40450 Shah Alam, Selangor, Malaysia.
  • Nasharuddin Zainal Department of Electrical, Electronic and Systems Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia, 43600 UKM Bangi, Selangor, Malaysia
  • W Mimi Diyana W Zaki Department of Electrical, Electronic and Systems Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia, 43600 UKM Bangi, Selangor, Malaysia

Keywords:

Iris Recognition, Iris Pattern, Specular Reflection, Iris Image Enhancement

Abstract

Iris recognition is a biometric system that uses human iris features to determine and verify the identity of human. Other biometric systems are fingerprint, face, ear, voice, gait, blood vessels and many more. A complete iris recognition system includes: iris acquisition, iris segmentation, feature extraction and matching. The main factor to obtain high segmentation and recognition accuracy is the quality of iris pattern. The quality of iris pattern can be affected because of specular reflection. Specular reflection happens during iris acquisition and it can reduce the features of iris pattern. This work is significant since the improved iris pattern can enhance the performance of iris localization, iris segmentation and feature extraction in the iris recognition system. In this paper, the iris image enhancement methods are proposed to remove the specular reflection. UBIRIS v1 and CASIA v4 databases are used for testing. Based on the results, the proposed methods managed to remove the specular reflection without affecting the iris image quality. The proposed methods also obtained fast execution time and low memory

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Published

2016-07-01

How to Cite

Jamaludin, S., Zainal, N., & W Zaki, W. M. D. (2016). The Removal of Specular Reflection in Noisy Iris Image. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 8(4), 59–64. Retrieved from https://jtec.utem.edu.my/jtec/article/view/1172