Stress-optical Effect Analysis on Silicon-on-Insulator Planar Waveguide

Authors

  • N. Nadia A. Aziz Micro and Nano Electronic (MINE), Centre for Telecommunications Research Innovations (CETRI), Faculty of Electronic & Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka (UTeM), 76100 Durian Tunggal, Melaka, Malaysia
  • Hazura Haroon Micro and Nano Electronic (MINE), Centre for Telecommunications Research Innovations (CETRI), Faculty of Electronic & Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka (UTeM), 76100 Durian Tunggal, Melaka, Malaysia
  • Hanim Abdul Razak Micro and Nano Electronic (MINE), Centre for Telecommunications Research Innovations (CETRI), Faculty of Electronic & Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka (UTeM), 76100 Durian Tunggal, Melaka, Malaysia
  • A. S Mohd Zain Micro and Nano Electronic (MINE), Centre for Telecommunications Research Innovations (CETRI), Faculty of Electronic & Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka (UTeM), 76100 Durian Tunggal, Melaka, Malaysia
  • S. K. Othman Micro and Nano Electronic (MINE), Centre for Telecommunications Research Innovations (CETRI), Faculty of Electronic & Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka (UTeM), 76100 Durian Tunggal, Melaka, Malaysia
  • Fauziyah Salehuddin Micro and Nano Electronic (MINE), Centre for Telecommunications Research Innovations (CETRI), Faculty of Electronic & Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka (UTeM), 76100 Durian Tunggal, Melaka, Malaysia

Keywords:

Birefringence, Silicon Photonics, Strain, Stress-Optical Effect,

Abstract

Abstract—Stress application can be used to modify the optical properties of a device. The stress-optic effect has been experimentally measured in strained silicon, making it a promising candidate material for realizing active photonic devices, such as optical modulators and switches. In this paper, we investigated the stress-optic effect induced by applied strain gradient in the silicon optical waveguides. The relation between stress-optic effect, strain, birefringence and the change in the optical properties is investigated. The structure of nanometer waveguide is analyzed by using the Multiphysics modeling to show the effects of stress analysis. The stress effects are then evaluated by the Structural Mechanics modules.

Author Biography

N. Nadia A. Aziz, Micro and Nano Electronic (MINE), Centre for Telecommunications Research Innovations (CETRI), Faculty of Electronic & Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka (UTeM), 76100 Durian Tunggal, Melaka, Malaysia

Faculty of Electronic Engineering & Computer Engineering (FKEKK)

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Published

2017-09-29

How to Cite

A. Aziz, N. N., Haroon, H., Abdul Razak, H., Mohd Zain, A. S., Othman, S. K., & Salehuddin, F. (2017). Stress-optical Effect Analysis on Silicon-on-Insulator Planar Waveguide. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 9(3), 67–76. Retrieved from https://jtec.utem.edu.my/jtec/article/view/1492

Issue

Vol. 9 No. 3: July - September 2017

Section

Articles

License

Copyright (c) 2024 Journal of Telecommunication, Electronic and Computer Engineering

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)

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