Ahmataku H, Mohamaddan S, Warren E, Yusuf M, Alias AA, Abdul Manas NH, Kipli K. Analysis of Gate Poly Delayering in SOI Wafer. JTEC [Internet]. 2018Mar.1 [cited 2024May4];10(1-12):85-7. Available from: https://jtec.utem.edu.my/jtec/article/view/3831