Arshad N, Salehuddin F, Salim S, Soin N. Defect-Oriented Test and Design-for-Testability Technique for Resistive Random Access Memory. JTEC [Internet]. 2015Dec.1 [cited 2024Dec.21];7(2):47-53. Available from: https://jtec.utem.edu.my/jtec/article/view/613