Ieamsaard J, Eika Sandnes F, Muneesawang P. Reducing False Detection during Inspection of HDD using Super Resolution Image Processing and Deep Learning. JTEC [Internet]. 2017Jun.1 [cited 2024Nov.23];9(2-5):91-5. Available from: https://jtec.utem.edu.my/jtec/article/view/2405