Alia, Fara Ashikin, Akihiro Odoriba, Masaki Hashizume, Hiroyuki Yotsuyanagi, and Shyue-Kung Lu. “Electrical Tests for Capacitive Open Defects in Assembled PCBs”. Journal of Telecommunication, Electronic and Computer Engineering (JTEC) 9, no. 3-2 (October 15, 2017): 49–52. Accessed April 17, 2024. https://jtec.utem.edu.my/jtec/article/view/2812.