Cheng, E. M., N. F. Mohd Nasir, A. B. Shahriman, S. A. Baharuddin, M. S. Abdul Majid, P. W. Leech, P. Tanner, and A. S. Holland. “Electromagnetic Interference (EMI) Analysis on Surface Roughness of 3C-Silicon Carbide (3C-SiC) Deposited on Silicon (Si) Substrate”. Journal of Telecommunication, Electronic and Computer Engineering (JTEC) 10, no. 1-17 (May 31, 2018): 73–77. Accessed November 24, 2024. https://jtec.utem.edu.my/jtec/article/view/4170.