Arshad, N., F. Salehuddin, S.I. Salim, and N. Soin. “Defect-Oriented Test and Design-for-Testability Technique for Resistive Random Access Memory”. Journal of Telecommunication, Electronic and Computer Engineering (JTEC) 7, no. 2 (December 1, 2015): 47–53. Accessed December 30, 2024. https://jtec.utem.edu.my/jtec/article/view/613.