Haron, Nor Zaidi, Siti Aisah Mat Junos@Yunus, and Abdul Hadi Abdul Razak. “Modeling and Simulation of Finite State Machine Memory Built-In Self Test Architecture for Embedded Memories”. Journal of Telecommunication, Electronic and Computer Engineering (JTEC) 1, no. 1 (December 1, 2009): 77–82. Accessed July 22, 2024. https://jtec.utem.edu.my/jtec/article/view/511.