Yadava, N., and R. K. Chauhan. “RF Performance Enhancement of Gallium Oxide MOSFET Using P-Type NiO Pocket Near Source and Drain Regions”. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), vol. 11, no. 4, Dec. 2019, pp. 19-23, https://jtec.utem.edu.my/jtec/article/view/5458.