Arshad, N., Salehuddin, F., Salim, S. and Soin, N. (2015) “Defect-Oriented Test and Design-for-Testability Technique for Resistive Random Access Memory”, Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 7(2), pp. 47–53. Available at: https://jtec.utem.edu.my/jtec/article/view/613 (Accessed: 23May2024).