A.H., A. M., P.S., M., Ahmad, I., Z. A., N. F., Mohd Zain, A., Salehuddin, F. and M.Sayed, N. (2018) “Threshold Voltage and Leakage Current Variability on Process Parameter in a 22 nm PMOS device”, Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 10(2-8), pp. 9–13. Available at: https://jtec.utem.edu.my/jtec/article/view/4450 (Accessed: 28March2024).