Syed-Mohamad, S. M., Haron, N. H. and McBride, T. (2017) “Test Adequacy Assessment Using Test-Defect Coverage Analytic Model”, Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 9(3-5), pp. 191–196. Available at: https://jtec.utem.edu.my/jtec/article/view/2990 (Accessed: 21December2024).