ARSHAD, N.; SALEHUDDIN, F.; SALIM, S.; SOIN, N. Defect-Oriented Test and Design-for-Testability Technique for Resistive Random Access Memory. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 7, n. 2, p. 47–53, 2015. Disponível em: https://jtec.utem.edu.my/jtec/article/view/613. Acesso em: 23 may. 2024.