TOMA, R. N.; MANIRUZZAMAN, M.; PANJIYAR, O. P.; HASSAN, M. M.; HASAN, M. N.; RAHMAN, M. A. Analysis of Crosstalk Noise for 2π RC Model considering Interconnect Parameters in Deep Submicron VLSI Circuit. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 11, n. 1, p. 49–55, 2019. Disponível em: https://jtec.utem.edu.my/jtec/article/view/4646. Acesso em: 18 apr. 2024.