MOHD ZAIN, A.; NGELAYANG, T.; SALEHUDDIN, F.; HAZURA, H.; IDRIS, S.; HANIM, A.; AH, A. The Impact of Gate-Induced Drain Leakage (GIDL) on Scaled MOSFETs for Low Power Device. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 10, n. 2-7, p. 69–72, 2018. Disponível em: https://jtec.utem.edu.my/jtec/article/view/4422. Acesso em: 26 apr. 2024.