CHENG, E. M.; MOHD NASIR, N. F.; SHAHRIMAN, A. B.; BAHARUDDIN, S. A.; ABDUL MAJID, M. S.; LEECH, P. W.; TANNER, P.; HOLLAND, A. S. Electromagnetic Interference (EMI) Analysis on Surface Roughness of 3C-Silicon Carbide (3C-SiC) Deposited on Silicon (Si) Substrate. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 10, n. 1-17, p. 73–77, 2018. Disponível em: https://jtec.utem.edu.my/jtec/article/view/4170. Acesso em: 6 may. 2024.