JULAI, N.; GURUSAMY, L.; SUHAILI, S. The Impact of Soft Error On C-Element with Different Technology. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 9, n. 3-10, p. 79–83, 2017. Disponível em: https://jtec.utem.edu.my/jtec/article/view/3158. Acesso em: 25 feb. 2024.