SYED-MOHAMAD, S. M.; HARON, N. H.; MCBRIDE, T. Test Adequacy Assessment Using Test-Defect Coverage Analytic Model. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 9, n. 3-5, p. 191–196, 2017. Disponível em: https://jtec.utem.edu.my/jtec/article/view/2990. Acesso em: 8 may. 2024.