NGELAYANG, T. B.; NOOR AZIZI, M. S.; HASSAN, N.; BOLQIAH EDRISA, M. Z.; PUTRA, M. H. The Effect of Gate-Induced Drain Leakage (GIDL) on Scaled MOSFETS of Low Power Consumptions. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 9, n. 1-3, p. 157–160, 2017. Disponível em: Acesso em: 23 apr. 2024.