ASYRAF, H.; SHAPIAI, M. I.; SETIAWAN, N. A.; WAN MUSA, W. S. N. S. Masking Covariance for Common Spatial Pattern as Feature Extraction. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 8, n. 11, p. 81–85, 2016. Disponível em: https://jtec.utem.edu.my/jtec/article/view/1414. Acesso em: 8 may. 2024.