KAMEL, N. K. .; OSMAN, K.; ZAINUDDIN, N.; YASUNO, T. Pin Electronic (PE) with Levels Specification Using ATE Tester. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 18, n. 1, p. 29–34, 2026. DOI: 10.54554/jtec.2026.18.01.004. Disponível em: https://jtec.utem.edu.my/jtec/article/view/6441. Acesso em: 4 apr. 2026.