TOLENTINO, L. K.; CRUZ, F. R.; CHUNG, W.-Y. Characterization of a 0.35-Micron-Based Analog MPPT IC at Various Process Corners. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 10, n. 1-9, p. 179–186, 2018. Disponível em: https://jtec.utem.edu.my/jtec/article/view/3897. Acesso em: 24 nov. 2024.