MOHAMAD ARIFIN, N.; MOHAMAD, F.; FONG, C. S.; AHMAD, N.; MUHD NOR, N. H.; IZAKI, M. Effects of Annealing Time on Electrodeposited-n-Cu2O Thin Film. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 9, n. 3-8, p. 129–132, 2017. Disponível em: https://jtec.utem.edu.my/jtec/article/view/3111. Acesso em: 23 nov. 2024.