IEAMSAARD, J.; EIKA SANDNES, F.; MUNEESAWANG, P. Reducing False Detection during Inspection of HDD using Super Resolution Image Processing and Deep Learning. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), [S. l.], v. 9, n. 2-5, p. 91–95, 2017. Disponível em: https://jtec.utem.edu.my/jtec/article/view/2405. Acesso em: 23 nov. 2024.