Mohd Zain, A., Ngelayang, T., Salehuddin, F., Hazura, H., Idris, S., Hanim, A., & AH, A. (2018). The Impact of Gate-Induced Drain Leakage (GIDL) on Scaled MOSFETs for Low Power Device. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 10(2-7), 69–72. Retrieved from https://jtec.utem.edu.my/jtec/article/view/4422