Cheng, E. M., Mohd Nasir, N. F., Shahriman, A. B., Baharuddin, S. A., Abdul Majid, M. S., Leech, P. W., Tanner, P., & Holland, A. S. (2018). Electromagnetic Interference (EMI) Analysis on Surface Roughness of 3C-Silicon Carbide (3C-SiC) Deposited on Silicon (Si) Substrate. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 10(1-17), 73–77. Retrieved from https://jtec.utem.edu.my/jtec/article/view/4170