Ieamsaard, J., Eika Sandnes, F., & Muneesawang, P. (2017). Reducing False Detection during Inspection of HDD using Super Resolution Image Processing and Deep Learning. Journal of Telecommunication, Electronic and Computer Engineering (JTEC), 9(2-5), 91–95. Retrieved from https://jtec.utem.edu.my/jtec/article/view/2405