[1]
Ngelayang, T.B., Noor Azizi, M.S., Hassan, N., Bolqiah Edrisa, M.Z. and Putra, M.H. 2017. The Effect of Gate-Induced Drain Leakage (GIDL) on Scaled MOSFETS of Low Power Consumptions. Journal of Telecommunication, Electronic and Computer Engineering (JTEC). 9, 1-3 (Mar. 2017), 157–160.